JMSSJ On-line

JMSSJ On-line, Vol. 55 (2007) No. 1, pp. 17-24

Simulation of Beam Profile of Multi-Turn Time-of-Flight Mass Spectrometers		>> Full Text PDF >> References
*Michisato TOYODA,^1,2 and Masaru NISHIGUCHI³** ¹ Department of Physics, Graduate School of Science, Osaka University, Toyonaka, OSAKA, JAPAN ² JST CREST, Kawaguchi, SAITAMA, JAPAN ³ Production/Design Technology Center, Shimadzu Corporation, Kyoto, JAPAN

The ion beam profiles of the multi-turn time-of-flight mass spectrometers “MULTUM” and “MULTUM II” were simulated using the ion trajectory simulation program “TRIO 2.0.” These ion optical systems satisfy the “perfect focusing” conditions and are suitable for an imaging mass spectrometer in stigmatic mode. From the simulation, it was clear that the higher order aberration of MULTUM II is smaller than that of MULTUM. A smaller initial lateral angular deviation makes aberration after circulation smaller in both the ion optical systems. In the ion optical system MULTUM II, the ion images should be measured at even numbered cycles, because the second-order coefficient (x\|xx) will be cancelled after every two cycles.

Key words: Multi-turn time-of-flight mass spectrometer, Beam profile, Imaging, Simulation